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Correlative Mechanical Microscopy

Application Overview

A core theme of materials science is the relationship between microstructure and mechanical properties. Mechanical microscopy provides a powerful new method to simultaneously measure microstructure and mechanical properties.

Analytical techniques such as EDS (Energy-Dispersive X-ray spectroscopy) and EBSD (Electron Backscatter Diffraction) allow for the characterization of local composition, as well as crystal structure and orientation information. The combination of these techniques with nanoindentation mapping offers new insights into the relationships between structure, composition, and mechanical properties of materials, through what we call Correlative Mechanical Microscopy.

Layered material analysis techniques with graphs for mechanical property correlation.

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