High-Temperature Module
The high-temperature module enables mechanical testing, such as nanoindentation, at controlled temperatures up to 400°C in an inert gas atmosphere. In combination with our microforce sensing probes featuring tip heating, controlled isotherm testing is possible.
|
Temperature range |
Oxidation prevention |
High-Temperature Module |
800 °C |
Vacuum |
Cryogenic Testing Module
The Cryogenic Temperature Module uses liquid nitrogen as a cooling agent to achieve temperatures as low as -150°C, allowing experiments to be conducted at extremely low temperatures. By operating under high-vacuum conditions, the iX05 effectively prevents condensation-related issues, ensuring smooth and reliable experimentation at cryogenic temperatures.
|
Temperature range |
Condensation prevention |
Cryogenic Module |
-150 °C |
Vacuum |
Scratch Testing Module
Combining an exchangeable sample stage with a piezoscanner and a FemtoTools 2-Axis Microforce Sensing Probe enables advanced techniques, such as nano-scratch and nano-wear testing, as well as SPM imaging, by facilitating the in-plane movement of the sample while simultaneously applying a normal force.
|
Travel range |
Noise floor |
Piezo-Scanner |
250 µm |
0.4 nm |
Ultra-Fast Mapping Module
The ultra-fast mapping module boosts the speed of indentation from 3 indents per second to up to 30 indents per second, enabling the generation of high-resolution maps with over 90’000 indents in under an hour. The specialized sample stage is essential for rapidly accelerating, stopping, stabilizing, performing the nanoindentation measurement, and then accelerating to the next indent position in under 33 milliseconds, all while maintaining exceptional accuracy.
|
Indentation speed |
Ultra-Fast Mapping Module |
30 Indents/s |
Microforce Sensing Probes
The Microforce Sensing Probes are sensors capable of measuring forces from sub-nanonewton to 2 newtons along the sensor’s probe axis. They are available with a wide variety of tip materials and geometries, including diamond Berkovich, cube corner, flat punch, wedge, conical, and more.
|
Range |
Noise Floor (10 Hz) |
S200 |
+/- 200 μN |
0.1 nN |
S2’000 |
+/- 2’000 μN |
0.5 nN |
S20’000 |
+/- 20’000 μN |
5 nN |
S200’000 |
+/- 200’000 μN |
50 nN |
S2’000’000 |
+/- 2’000’000 μN |
500 nN |
Two-Axis Microforce Sensing Probes
The Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based multi-axis microforce sensors capable of simultaneous measuring forces in the two in-plane directions. The primary application for these sensors is nano-scratch, nano-tribology and nano-wear testing.
|
Range |
Noise Floor (10 Hz) |
Normal |
+/- 20’000 μN |
10 nN |
Tangential |
+/- 20’000 μN |
10 nN |
High-Temperature Microforce Sensing Probes
The High-Temperature Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based microforce sensors capable of measuring forces from 200mN to 2 µN. Furthermore, with the monolithically integrated tip heater, the temperature of the nanoindenter tip can be accurately matched to the temperature of the sample, enabling isothermal testing conditions.
|
Force range |
Force resolution (noise at 10 Hz) |
FT-S200'000-HT |
+/- 200 mN |
100 nN |