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iX05

Ultra-fast nanoindentation
in operando conditions

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iX05 nanoindenter, a standalone MEMS-based nanoindenter for material property analysis in a wide range of operando conditions: high-temperature nanoindentation. low-temperature nanoindentation, high strain rates nanoindentation ...

The iX05 is an operando nanoindenter. It is designed to measure local mechanical properties in real-world conditions such as high temperatures, low temperatures, high strain rates, or in liquid environments.

Traditional nanoindenters are optimized to measure materials in laboratory conditions. However, materials in practical applications often experience extreme environments that strongly influence their mechanical behavior. The iX05 is optimized to test materials in conditions representative of their targeted application. 

The iX05 combines the high resolution and speed offered by MEMS-based technology with fast control electronics and environment control, making it the ultimate tool for measuring and visualizing mechanical properties of materials in a wide range of testing conditions.

Glowing MEMS-based force sensing nanoindentation probe.

The iX05 operando nanoindentation system offers high-temperature testing up to +800°C and cryo-temperature testing down to -150°C. It features a motorized chamber with environment control for testing in an inert gas atmosphere or high vacuum, minimizing oxidation and contamination.

-150 °C to +800 °C

down to 5⋅ 10-4 mBar

Temperature range Operating pressure
SEM micro-image of MEMS force sensor for nanoindenter.

The iX05 offers ultra-fast nanoindentation capabilities, allowing nanoindentation mapping at up to 30 indentations per second. It delivers unmatched performance at high speeds by combining FemtoTools MEMS force sensors with ultra-fast electronics to provide sampling rate of 2 MHz and feedback frequency of 500 kHz.

up to 2N

down to 100 pn

Temperature range Force noise floor (at 10 Hz)
Displacement-controlled indentation matrix obtained after performing mechanical microscopy on a metallurgical sample

The iX05 offers ultra-high resolution nanoindentation capabilities, to detect even the smallest variations in hardness and elastic modulus. It features displacement sensing with a noise floor below 5 pm over a range of 20 um, spanning 7 orders of magnitude. The instrument also includes interchangeable MEMS-based force sensors for SI-traceable force metrology, ranging from 100 pN (noise floor) to 2 N, covering 10 orders of magnitude. To ensure accuracy and precision, the iX05 comes with automated, high-precision calibration procedures, allowing for seamless use.

Application notes

Accessories

High-temperature module for nanoindentation tests up to 800°C in high vacuum conditions.

High-Temperature Module

The high-temperature module enables mechanical testing, such as nanoindentation, at controlled temperatures up to 400°C in an inert gas atmosphere. In combination with our microforce sensing probes featuring tip heating, controlled isotherm testing is possible.


Temperature range Oxidation prevention
High-Temperature Module  800 °C Vacuum
Cryogenic testing module for nanoindentation tests at low temperatures down to -150 °C in high vacuum conditions.

Cryogenic Testing Module

The Cryogenic Temperature Module uses liquid nitrogen as a cooling agent to achieve temperatures as low as -150°C, allowing experiments to be conducted at extremely low temperatures. By operating under high-vacuum conditions, the iX05 effectively prevents condensation-related issues, ensuring smooth and reliable experimentation at cryogenic temperatures.


Temperature range Condensation prevention
Cryogenic Module -150 °C Vacuum
Sample stage with piezoscanner and 2-axis microforce sensing probe for scratch material testing.

Scratch Testing Module

Combining an exchangeable sample stage with a piezoscanner and a FemtoTools 2-Axis Microforce Sensing Probe enables advanced techniques, such as nano-scratch and nano-wear testing, as well as SPM imaging, by facilitating the in-plane movement of the sample while simultaneously applying a normal force.


Travel range Noise floor
Piezo-Scanner 250 µm 0.4 nm
The ultra-fast mapping module for high-resolution maps with over 90’000 indents in under an hour.

Ultra-Fast Mapping Module

The ultra-fast mapping module boosts the speed of indentation from 3 indents per second to up to 30 indents per second, enabling the generation of high-resolution maps with over 90’000 indents in under an hour. The specialized sample stage is essential for rapidly accelerating, stopping, stabilizing, performing the nanoindentation measurement, and then accelerating to the next indent position in under 33 milliseconds, all while maintaining exceptional accuracy.


Indentation speed
Ultra-Fast Mapping Module 30 Indents/s
FT-S Microforce Sensing Probe, versatile in measuring forces with various tip options.

Microforce Sensing Probes

The Microforce Sensing Probes are sensors capable of measuring forces from sub-nanonewton to 2 newtons along the sensor’s probe axis. They are available with a wide variety of tip materials and geometries, including diamond Berkovich, cube corner, flat punch, wedge, conical, and more.


Range Noise Floor (10 Hz)
S200 +/- 200 μN 0.1 nN
S2’000 +/- 2’000 μN 0.5 nN
S20’000 +/- 20’000 μN 5 nN
S200’000 +/- 200’000 μN 50 nN
S2’000’000 +/- 2’000’000 μN 500 nN
FT-S Microforce Sensing Probe, versatile in measuring forces with 2-axis movement.

Two-Axis Microforce Sensing Probes

The Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based multi-axis microforce sensors capable of simultaneous measuring forces in the two in-plane directions. The primary application for these sensors is nano-scratch, nano-tribology and nano-wear testing.


Range Noise Floor (10 Hz)
Normal +/- 20’000 μN 10 nN
Tangential +/- 20’000 μN  10 nN
FT-S Microforce Sensing Probe, versatile in measuring forces with high temperature capabilities.

High-Temperature Microforce Sensing Probes

The High-Temperature Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based microforce sensors capable of measuring forces from 200mN to 2 µN. Furthermore, with the monolithically integrated tip heater, the temperature of the nanoindenter tip can be accurately matched to the temperature of the sample, enabling isothermal testing conditions.

Force range Force resolution (noise at 10 Hz)
FT-S200'000-HT +/- 200 mN 100 nN

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